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Intel Published Articles Published in or about Q2, 2006

  • Abella, J.; Gonzalez, A. AMIE-LSQ: Set–Associative Multiple-Instruction Entry Load/Store Queue. 20th International Parallel and Distributed Processing Symposium, IPDPS, April 2006. Pages 1–10.
  • Agarwal, A.; Mukhopadhyay, S.; Raychowdhury, A.; Roy, K.; Kim, C.H.Leakage Power Analysis and Reduction for Nanoscale Circuits. IEEE Micro, Volume 26, Issue 2, March–April 2006. Pages 68–80. Digital Object Identifier 10.1109/MM.2006.39.
  • Ahmadi, S.; Jelinek, M. On the Architecture, Operation, and Applications of VMR-WB: The New CDMA 2000 WidebandSpeech Coding Standard. IEEE Communications Magazine, Volume 44, Issue 5, May 2006. Pages 74–81. Digital ObjectIdentifier 10.1109/MCOM.2006.1637950.
  • Antonelli, S. B.; Allen, T. L.; Johnson, D. C.; Dubin, V. M.Determining the Role of W in Suppressing Crystallization of Electroless Ni-W-P Films. J. Electrochem. Soc., Volume 153, Issue 6, April 2006. Pages J46–J49.
  • Ataman. Caglar Ataman, Yves Petremand, Wilfried Noell, Hakan Ürey, Marc Epitaux, Nico F. de Rooij.A 2D MEMS Stage for Optical Applications. Proceedings of SPIE, Volume 6186, MEMS, MOEMS, and Micromachining II, April 21, 2006.
  • Bañres. David Bañres, Jordi Cortadella, Mike Kishinevsky.Dominator-Based Partitioning For Delay Optimization. Great Lakes Symposium on VLSI, April 2006. Pages 67–72.
  • Bly. Sara Bly, Bill Schilit, David W. McDonald, Barbara Rosario, Ylian Saint-Hilaire.Broken Expectations In The Digital Home. Conference on Human Factors in Computing Systems, April 2006. Pages 568 – 573.
  • Bodapati, S.; Najm, F.N. High-Level Current Macro Model for Logic Blocks. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 25, Issue 5, May 2006.Pages 837–855. Digital Object Identifier 10.1109/TCAD.2005.855976.
  • Brevnov. Dmitri A. Brevnov, Thomas C. Gamble, Plamen Atanassov, Gabriel P. Lóez, Todd M. Bauer, Zariff A.Chaudhury, Chris D. Schwappach, Larry E. Mosley. Electrochem. Electrochemical Micromachining. Solid-State Lett., Volume 9, Issue 8, May 2006. Pages B35–B38.
  • Budiman. A. S. Budiman, W. D. Nix, N. Tamura, B. C. Valek, K. Gadre, J. Maiz, R. Spolenak, J. R. Patel.Crystal Plasticity in Cu Damascene Interconnect Lines Undergoing Electromigration as Revealed by Synchrotron X–RayMicrodiffraction. Applied Physics Letters, Volume 88, Issue 23, June 2006.
  • Cernosek. R. W. Cernosek, A. L. Robinson, D. Y. Cruz, D. R. Adkins, J. L. Barnett, J. M. Bauer, M. G. Blain, J.E. Byrnes, S. M. Dirk, G. R. Dulleck, J. A. Ellison, J. G. Fleming, T. W. Hamilton, E. J. Heller, S. W. Howell, R. J.Kottenstette, P. R. Lewis, R. P. Manginell, M. W. Moorman, C. D. Mowry, R. G. Manley, M. Okandan, K. Rahimian, G. J.Shelmidine, R. J. Shul, R. J. Simonson, S. S. Sokolowski, J. J. Spates, A. W. Staton, D. E. Trudell, D. R. Wheeler, W.G. Yelton. Micro-Analytical Systems for National Security Applications. Proceedings of SPIE, Volume 6223, Micro (MEMS) and Nanotechnologies for Space Applications, May 2006.
  • Chen, Miaobo; Goldenberg, S.; Srinivas, S.; Ushakov, V.; Wang, Young; Zhang, Qi; Lin, E.; Zach, Y.Java JNI Bridge: A Framework for Mixed Native ISA Execution. International Symposium on Code Generation and Optimization, CGO 2006, March 2006.Pages 65–75. Digital Object Identifier 10.1109/CGO.2006.22.
  • Cheng. Wen-Hao Cheng, Jeff Farnsworth.Mask Absorber Material Dependence of 2D OPC in ArF High NA Lithography. Proceedings of SPIE-Volume 6281, 22nd European Mask and Lithography Conference, June 2006.
  • Cohen. Oded Cohen, Richard Jones, Omri Raday, Alexander Fang, Nahum Izhaky, Doron Rubin, Mario Paniccia.SOI-Based Monolithic Integration of Sion and Si Planar Optical Circuits. Proceedings of SPIE, Volume 6183, Integrated Optics, Silicon Photonics, and Photonic Integrated Circuits, April 2006.
  • Consolvo. Sunny Consolvo, Katherine Everitt, Ian Smith, James A. Landay.Design Requirements for Technologies that Encourage Physical Activity. Proceedings of the SIGCHI Conference on Human Factors in Computing Systems, April 2006. Pages 457–466.
  • Counts. Scott Counts, Henri ter Hofte, Ian Smith.Mobile Social Software: Realizing Potential, Managing Risks. Conference on Human Factors in Computing Systems, April 2006. Pages 1703–1706.
  • Covington, M.J.; Sastry, M.R.; Manohar, D.J.Attribute-Based Authentication Model for Dynamic Mobile Environments. Proceedings (Lecture Notes in Computer Science Vol. 3934), April 2006. Pages 227–42.
  • Dardan. Shana Dardan, Doug Busch, David Sward.An Application of the Learning Curve and the Nonconstant–Growth Dividend Model: IT Investment Valuations at Intel Corporation. Decision Support Systems, Volume 41, Issue 4, May 2006. Pages 688–697.
  • Du. Bowei Du, Michael Demmer, Eric Brewer.Analysis of WWW Traffic in Cambodia and Ghana. International World Wide Web Conference, May 2006. Pages 771–780.
  • Du. Yan Du, Chang Ju Choi, Guojing Zhang, Seh-Jin Park, Pei-Yang Yan, Ki–Ho Baik.TaN-Based EUV Mask Absorber Etch Study. Proceedings of SPIE, Volume 6283, Photomask and Next-Generation Lithography Mask Technology XIII, May 2006.
  • Elmala, M.; Paramesh, J.; Soumyanath, K. A 90-nm CMOS Doherty Power Amplifier with Minimum AM–PM Distortion. IEEE Journal of Solid-State Circuits, Volume 41, Issue 6, June 2006.Pages 1323–1332. Digital Object Identifier 10.1109/JSSC.2006.874284.
  • Fabry. Laszlo Fabry, Robert Hoelzl, Andre Andrukhiv, Kei Matsumoto, Joann Qiu, Sergei Koveshnikov, MichaelGoldstein, Ann Grabau, Hiroshi Horie, Ryuji Takeda. Test Methods for Measuring Bulk Copper and Nickel in Heavily Doped P-Type Silicon Wafers. J. Electrochem. Soc., Volume 153, Issue 6, April 2006. Pages G566–G571.
  • Funiak. Stanislav Funiak, Carlos Guestrin, Mark Paskin, Rahul Sukthankar.Distributed Localization of Networked Cameras. Information Processing In Sensor Networks, April 2006. Pages 34–42.
  • Ghadiali. Firoz Ghadiali, Vikram Tolani, Rajesh Nagpal, Tod Robinson, Jeff LeClaire, Ron Bozak, David A. Lee,Roy White. Femtopulse Laser-Based Mask Repair in the DUV Wavelength Regime. Proceedings of SPIE, Volume 6283, Photomask and Next-Generation Lithography Mask Technology XIII, May 2006.
  • Gold. J. S. Gold, J. M. Lannon, Jr., K. S. Ziemer, M. Guntu, V. L. Tolani, C. D. Stinespring.Characterization of a Methyl Radical Source for Ultrahigh Vacuum Thin Film Growth Studies. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Volume 24, Issue 4, July 2006. Pages 1044–1050.
  • Goodman. Elizabeth Goodman, Brooke E. Foucault.Seeing Fit: Visualizing Physical Activity in Context. Conference on Human Factors in Computing Systems, April 2006. Pages 797–802.
  • Guo, R.; Mitra, S.; Amyeen, E.; Lee, J.; Sivaraj, S.; Venkataraman, S.Evaluation of Test Metrics: Stuck–At, Bridge Coverage Estimate and Gate Exhaustive. Proceedings, 24th IEEE VLSI Test Symposium, April–May 2006. Pages: 6 pp. Digital Object Identifier 10.1109/VTS.2006.34.
  • Guo. Jing Guo, Edwin C. Kan, Udayan Ganguly, Yuegang Zhang.High Sensitivity and Nonlinearity of Carbon Nanotube Charge–Based Sensors. Journal of Applied Physics, Volume 99, Issue 8, April 2006.
  • Ha. Jinyong Ha, Kevin A. Williams, Richard V. Penty, Ian H. White, Madeleine Glick.IPDR Improvement and Gain Reduction in a Beam Holding SOA. Proceedings of SPIE, Volume 6184, Semiconductor Lasers and Laser Dynamics II, April 2006.
  • Hancock. Mark S. Hancock, John David Miller, Saul Greenberg, Sheelagh Carpendale.Exploring Visual Feedback of Change Conflict in a Distributed 3D Environment. Proceedings of the Working Conference on Advanced Visual Interfaces, May 2006. Pages 209–216.
  • Haque. Rezaul Haque, Andrzej Sendrowski, Bob Baltar,Saad Monasa.Design of a High–Speed, Low–Noise CMOS Data Output Buffer. Integration, the VLSI Journal, Volume 39, Issue 3, June 2006. Pages 252–266.
  • Huang, Hai; Mason, R.A. Model Checking Technologies for Web Services. The Fourth IEEE Workshop on Software Technologies for Future Embedded and Ubiquitous Systems, 2006, and the 2006 Second International Workshop onCollaborative Computing, Integration, and Assurance, SEUS 2006/WCCIA 2006, April 2006. Pages 217–224. Digital Object Identifier 10.1109/SEUS-WCCIA.2006.29.
  • Im, Chansik; Kim, K.H. A Hybrid Approach in TADE for Derivation of Execution Time Bounds of Program–Segments inDistributed Real-Time Embedded Computing. Ninth IEEE International Symposium on Object and Component-Oriented Real-TimeDistributed Computing (ISORC), April 2006. Pages 9 pp. Digital Object Identifier 10.1109/ISORC.2006.5
  • Jamieson. Andrew Jamieson, Thuc Dam, Ki-Ho Baik, Ken Duerksen, Elie Eidson, Keiji Akai, Kazuya Hisano, NorifumiKohama, Shinichi Machidori. The Design and Qualification of the TEL CLEAN TRACK ACTTM M Photomask Coating Tool at Intel. Proceedings of SPIE, Volume 6283, Photomask and Next-Generation Lithography Mask Technology XIII, May 2006.
  • Jeong, J.; Dubois, M. Cache Replacement Algorithms with Nonuniform Miss Costs. IEEE Transactions on Computers, Volume 55, Issue 4, April 2006.Pages 353–365. Digital Object Identifier 10.1109/TC.2006.50.
  • Jeong. Jaeheon Jeong, Per Stenström, Michel Dubois.Simple Penalty-Sensitive Replacement Policies for Caches. Conference On Computing Frontiers, May 2006. Pages 341–352.
  • Kadaksham. John Kadaksham, Dong Zhou, M. D. Murthy Peri, Ivin Varghese, Florence Eschbach, Cetin Cetinkaya.Nanoparticle Removal from EUV Photomasks Using Laser Induced Plasma Shockwaves. Proceedings of SPIE, Volume 6283, Photomask and Next-Generation Lithography Mask Technology XIII, May 2006.
  • Kapila. Vivek Kapila, Pierre A. Deymier, Hrishikesh Shende, Viraj Pandit, Srini Raghavan, Florence O. Eschbach.Megasonic Cleaning, Cavitation, and Substrate Damage: An Atomistic Approach. Proceedings of SPIE, Volume 6283, Photomask and Next-Generation Lithography Mask Technology XIII, May 2006.
  • Kasulasrinivas, V.; Chakravarty, S.;Tran, E.N. Silicon Evaluation of Logic Proximity Bridge Patterns. Proceedings, 24th IEEE VLSI Test Symposium, May 2006. Pages 6 pp. Digital Object Identifier 10.1109/VTS.2006.82.
  • Keswani. Manish K. Keswani, Hyosang Lee, Suryadevara Babu, Udaya Patri, Youngki Hong, Laertis Economikos,Michael Goldstein, Len Borucki, Ara Philipossian, Y. Zhuang. Study Of Inhibition Characteristics of Slurry Additives in Copper CMP Using Force Spectroscopy. Silicon Materials Science and Technology X, May 2006.
  • Kim. Jung Hyeun Kim, Heinz Fissan, Christof Asbach, Se-Jin Yook, David Y. H. Pui, Kevin J. Orvek.Investigation of Thermophoretic Protection with Speed-Controlled Particles at 100, 50, and 25 mTorr. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Volume 24, Issue 3, May 2006. Pages 1178–1184.
  • Kincal, Serkan.Impact of Polish Pad Imperfections on Chemical Mechanical Polishing Defects. J. Electrochem. Soc., Volume 153, Issue 8, June 2006. Pages G742–G745.
  • Kumar, P.; Rojas–Gonzalez, M. Novel 3–Switch Dual Output Buck Voltage Regulator. Twenty–First Annual IEEE Applied Power Electronics Conference and Exposition, APEC '06, March 2006.7 pages. Digital Object Identifier 10.1109/APEC.2006.1620579.
  • Kwark. Young-Je Kwark, J. Pablo Bravo-Vasquez, Manish Chandhok, Heidi Cao, Hai Deng, Eric Gullikson,Christopher K. Ober. Absorbance Measurement of Polymers at Extreme Ultraviolet Wavelength: Correlation Between Experimental and Theoretical Calculations. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Volume 24, Issue 4, July 2006. Pages 1822–1826.
  • Lee. Kyung man Lee, Sanjay Yedur, Dave Hetzer, Malahat Tavassoli, Kiho Baik.CD and Profile Metrology of Embedded Phase Shift Masks Using Scatterometry. Proceedings of SPIE–Volume 6281, 22nd European Mask and Lithography Conference, June 2006.
  • Lee. Kyung-man Lee, Sanjay Yedur, Wen-hao Cheng, Malahat Tavassoli, Kiho Baik.Scatterometry Based CD And Profile Metrology of Chrome-Less Masks Using Optical Digital Profilometry. Proceedings of SPIE, Volume 6283, Photomask and Next-Generation Lithography Mask Technology XIII, May 2006.
  • Li, Bingchen; Kang Chen; Zhiteng Huang; Rajic, H.L.; Kuhn, R.H.;
    Speeding up NGB with Distributed File Streaming Framework. 20th International Parallel and Distributed Processing Symposium, IPDPS 2006, April 2006. Pages 1–8.
  • Li, Jianhui; Qi Zhang; Shu Xu; Bo Huang.Optimizing Dynamic Binary Translation for SIMD Instructions. International Symposium on Code Generation and Optimization, CGO 2006, March 2006. Pages 269–280. Digital Object Identifier 10.1109/CGO.2006.27.
  • Li, Wenlong ; Li, E.; Meng, Ran; Wang, Tao; Dulong, C.;
    Performance Analysis of Java Concurrent Programming: A Case Study of Video Mining System. 20th International Parallel and Distributed Processing Symposium, IPDPS 2006, April 2006. Pages 1–8.
  • Li, Wenlong; Wang, Tao; Li, E.; Baker, D.; Jin, Li; Ge, S.; Chen, Yurong; Zhang,, Yimin.Parallelization and Performance Characterization of Protein 3D Structure Prediction of Rosetta. 20th International Parallel and Distributed Processing Symposium, IPDPS 2006, April 2006. Pages 1–8.
  • Li. Liangliang Li, Shan X. Wang, Kyu-Pyung Hwang, Yongki Min, Ming Mao, Thomas Schneider, Randhir Bubber.Package Compatibility and Substrate Dependence of Granular Soft Magnetic Material Cofehfo Developed by ReactiveSputtering. Journal of Applied Physics, Volume 99, Issue 8, April 2006.
  • Li. Zhuoyuan Li, Xianlong Hong, Qiang Zhou, Shan Zeng, Jinian Bian, Hannah Yang, Vijay Pitchumani, Chung–KuanCheng. Integrating Dynamic Thermal Via Planning with 3D Floorplanning Algorithm. International Symposium on Physical Design, April 2006. Pages 178–185.
  • Liang. Ted Liang, Guojing Zhang, Patrick Naulleau, Alan Myers, Seh-Jin Park, Alan Stivers, Gilroy Vandentop.EUV Mask Pattern Defect Printability. Proceedings of SPIE, Volume 6283, Photomask and Next-Generation Lithography Mask Technology XIII, May 2006.
  • Link. A. Link, R. Sooryakumar, R. S. Bandhu, G. A. Antonelli.Brillouin Light Scattering Studies of the Mechanical Properties of Ultrathin Low-K Dielectric Films. Journal of Applied Physics, Volume 1, Issue 1, July 2006.
  • Liu, J.; Wu, Y.Performance Characterization of the 64–Bit X86 Architecture from Compiler Optimizations' Perspective. Proceedings (Lecture Notes in Computer Science Vol.3923), March 2006. Pages 155–69.
  • McDonald. David W. McDonald, Bill N. Schilit, Sara Bly.IT@Home: unraveling Complexities Of Networked Devices In The Home. Conference on Human Factors in Computing Systems, April 2006. Pages 1711–1713.
  • Mercado, L.L.; Phillips, B.; Sahasrabudhe, S.; Sedillo, J.P.; Bray, D.; Monroe, E.; Kang Joon Lee; Lo, G.Handheld Use Condition–Based Bend Test Development. IEEE Transactions on Advanced Packaging, [see also IEEE Transactions on Components, Packaging and Manufacturing Technology, Part B: Advanced Packaging], Volume 29, Issue 2,May 2006. Pages 240–249. Digital Object Identifier 10.1109/TADVP.2006.871201.
  • Morrow, P.R.; Park, C.-M.; Ramanathan, S.; Kobrinsky, M.J.; Harmes, M.Three–Dimensional Wafer Stacking via Cu-Cu Bonding Integrated with 65-Nm Strained-Si/Low–K CMOS Technology. IEEE Electron Device Letters, Volume 27, Issue 5, May 2006. Pages 335 – 337. Digital Object Identifier 10.1109/LED.2006.873424.
  • Natarajan, S.; Patil, S.; Chakravarty, S. Path Delay Fault Simulation on Large Industrial Designs. Proceedings, 24th IEEE VLSI Test Symposium, April–May 2006.Pages 6 pp. Digital Object Identifier 10.1109/VTS.2006.55.
  • Ozdal, M.M.; Wong, M.D.F. Algorithms for Simultaneous Escape Routing and Layer Assignment of Dense PCBs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 25, Issue 8, Aug. 2006.Pages 1510–1522. Digital Object Identifier 10.1109/TCAD.2005.857376.
  • Parkhurst, Jeff.From Single Core to Multi–Core to Many Core: Are We Ready for a New Exponential?Great Lakes Symposium on VLSI, April 2006. Pages 210–210.
  • Paulos. Eric Paulos, Chris Beckmann.Sashay: Designing for Wonderment. Conference on Human Factors in Computing Systems, April 2006. Pages 881–884.
  • Prasher, Ravi.Thermal Transport due to Phonons in Random Nano-Particulate Media in the Multiple And Dependent(Correlated) Elastic Scattering Regime. Journal of Heat Transfer, Volume 128, Issue 7, July 2006. Pages 627–637.
  • Prasher. Ravi Prasher, Prajesh Bhattacharya, Patrick E. Phelan.Brownian–Motion–Based Convective-Conductive Model for the Effective Thermal Conductivity of Nanofluids. Journal of Heat Transfer, Volume 128, Issue 6, June 2006. Pages 588–595.
  • Pratap, R.J.; Sen, P.; Davis, C.E.; Mukhophdhyay, R.; May, G.S.; Laskar, J.Neurogenetic Design Centering. IEEE Transactions on Semiconductor Manufacturing, Volume 19, Issue 2, May 2006.Pages 173–182. Digital Object Identifier 10.1109/TSM.2006.873517.
  • Prstic. Suzana Prstic, Avram Bar-Cohen."Heat Shield"—An Enhancement Device for an Unshrouded, Forced Convection Heat Sink. Journal of Electronic Packaging, Volume 128, Issue 2, June 2006. Pages 172–176.
  • Reda. Sherief Reda, Amit Chowdhary.Effective Linear Programming Based Placement Methods. International Symposium on Physical Design, April 2006. Pages 186–191.
  • Rice. Bryan J. Rice, Heidi Cao, Michael Grumski, Jeanette Roberts.The Limits of CD Metrology. Microelectronic Engineering, Volume 83, Issues 4–9, April–September 2006. Pages 1023–1029.
  • Roberts. Jeanette Roberts, Terence Bacuita, Robert L. Bristol, Heidi Cao, Manish Chandhok, Sang H. Lee, MichaelLeeson, Ted Liang, Eric Panning, Bryan J. Rice, Uday Shah, Melissa Shell, Wang Yueh, Guojing Zhang.Exposing Extreme Ultraviolet Lithography at Intel. Microelectronic Engineering, Volume 83, Issues 4–9, April–September 2006. Pages 672–675.
  • Rong, Haisheng; Jones, R.; Liu, Ansheng; Paniccia, M.; Cohen, O.; Hak, D.Silicon Based Lasers and Amplifiers via Stimulated Raman Scattering. Optical Fiber Communication Conference, 2006 and the 2006 National Fiber Optic Engineers Conference, March 2006. Pages 1–3.
  • Sawyer. Sawyer, S.; Le Cheminant, G.Digital and Microwave Worlds Converge in 10-Gbps Backplane Design and Test. EDN, Volume 51, Issue 7, 30 March 2006. Pages 63–70.
  • Schaelicke. Schaelicke, L.; Parker, M.The Design and Utility of the ML-RSIM System Simulator. Journal of Systems Architecture, Volume 52, Issue 5, May 2006. Pages 283–97.
  • Sharp, R.; Scott, J.; Beresford, A.R.Secure Mobile Computing via Public Terminals. Proceedings (Lecture Notes in Computer Science Vol. 3968), May 2006. Pages 238–53.
  • Shelar, R.S.; Saxena, P.; Sapatnekar, S.S.Technology Mapping Algorithm Targeting Routing Congestion Under Delay Constraints. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 25, Issue 4, April 2006. Pages 625–636. Digital Object Identifier 10.1109/TCAD.2006.870078.
  • Simmons, E.The Usage Model: Describing Product Usage during Design and Development. IEEE Software, Volume 23, Issue 3, May–June 2006. Pages 34–41. Digital Object Identifier 10.1109/MS.2006.87.
  • Sohn. Timothy Sohn, William G. Griswold, James Scott, Anthony LaMarca, Yatin Chawathe, Ian Smith, Mike Chen.Experiences With Place Lab: An Open Source Toolkit for Location–Aware Computing. Proceeding of the 28th International Conference on Software Engineering, May 2006. Pages 462–471.
  • Stolicny, C. ITC 2005 Panels. IEEE Design & Test of Computers, Volume 23, Issue 2, March–April 2006. Pages164–166. Digital Object Identifier 10.1109/MDT.2006.45
  • Sukthankar, R.; Yan Ke; Hoiem, D.Semantic Learning for Audio Applications: A Computer Vision Approach. 2006 Conference on Computer Vision and Pattern Recognition Workshop, June 2006. Pages 112–112. Digital Object Identifier 10.1109/CVPRW.2006.191.
  • Timotijevic. Branislav D. Timotijevic, Graham T. Reed, Richard Jones, Ansheng Liu, Albert Michaeli, Goran Z.Mashanovich. Optical Filters In Silicon-On-Insulator: Design Considerations for Devices Based Upon Strip and RibWaveguides. Proc. SPIE 6350, Workshop on Optical Components for Broadband Communication, July 2006.
  • Tran, E.N.; Kasulasrinivas, V.; Chakravarty, S.Silicon Evaluation of Logic Proximity Bridge Patterns. Proceedings, 24th IEEE VLSI Test Symposium, April–May 2006. Pages:6 pp. Digital Object Identifier 10.1109/VTS.2006.82.
  • Unsal, O.S.; Ergin, O.; Vera, X.; Gonzalez, A.;Empowering a Helper Cluster through Data–Width Aware Instruction Selection Policies. 20th International Parallel and Distributed Processing Symposium, IPDPS 2006, April 2006. Pages 1–10.
  • Ustyuzhanin, P.; Sundick, Y.; Geva-Mittelberg, G.; Shroff, Y.; Goldstein, M.Multi–Stacked MEMS Nano–Membranes for Coherent Extreme Ultraviolet Emission. Microelectronic Engineering, Volume 83, Issues 4–9, April–Sept. 2006. Pages 1245–8.
  • Wang, Tao; Li, Jianguo; Diao, Qian; Hu, Wei; Zhang, Yimin; Dulong, C.Semantic Event Detection Using Conditional Random Fields. 2006 Conference on Computer Vision and Pattern Recognition Workshop, June 2006. Pages 109–109. Digital Object Identifier 10.1109/CVPRW.2006.190.
  • Wang, Xiangcheng; Zhou, Hua; Batarseh, M.; Batarseh, I.; Chickamenahalli, S.A.; Stanford, E.Active Transient Voltage Compensator Design for VR Load Line Improvement. Twenty-First Annual IEEE Applied Power Electronics Conference and Exposition, 2006. APEC '06, March 2006. Pages:6 pp. Digital Object Identifier 10.1109/APEC.2006.1620516
  • Want, R.Global Perspectives. IEEE Pervasive Computing, Volume 5, Issue 2, April–June 2006.Pages 4–5. Digital Object Identifier 10.1109/MPRV.2006.30.
  • Wilcox. Nathan Wilcox, Matt Vernon, Andrew Jamieson.Electron Beam Lithography Time Dependent Dose Correction for Reticle CD Uniformity Enhancement. Proceedings of SPIE, Volume 6283, Photomask and Next-Generation Lithography Mask Technology XIII, May 2006.
  • Wong, K.L.; Rahal-Arabi, T.; Ma, M.; Taylor, G.Enhancing Microprocessor Immunity to Power Supply Noise with Clock–Data Compensation. IEEE Journal of Solid–State Circuits, Volume 41, Issue 4, April 2006. Pages 749–758. Digital Object Identifier 10.1109/JSSC.2006.870925.
  • Yan. Pei-Yang Yan, Long He, Andy Ma, Kevin Orvek.Clean Mask Shipping Module Development and Demonstration for EUVL Masks and Blanks. Proceedings of SPIE, Volume 6283, Photomask and Next-Generation Lithography Mask Technology XIII, May 20, 2006.
  • Yu, Haifeng.Signed Quorum Systems. Distributed Computing Volume 18, Issue 4, March 2006. Pages 30–23.
  • Zadorojniy, A.; Shwartz, A.;Robustness of policies in constrained Markov decision processes. IEEE Transactions on Automatic Control, Volume 51, Issue 4, April 2006. Pages 635–638. Digital Object Identifier 10.1109/TAC.2006.872754.
  • Zhang. Chong Zhang, Islam A. Salama, Nathaniel R. Quick, Aravinda Kar.One–Dimensional Transient Analysis Of Volumetric Heating For Laser Drilling. Journal of Applied Physics, Volume 99, Issue 11, June 2006.
  • Zhang. Guojing Zhang, Pei-Yang Yan, Ted Liang, Yan Du, Peter Sanchez, Seh–jin Park, Eric J. Lanzendorf, Chang-Ju Choi, Emily Y. Shu, Alan R. Stivers, Jeff Farnsworth, Kangmin Hsia, Manish Chandhok, Michael J. Leeson, GilroyVandentop. EUV Mask Process Development and Integration. Proceedings of SPIE, Volume 6283, Photomask and Next-Generation Lithography Mask Technology XIII, May 2006.
  • Zhang. Xinwen Zhang, Masayuki Nakae, Michael J. Covington, Ravi Sandhu.A Usage–Based Authorization Framework for Collaborative Computing Systems. Symposium on Access Control Models and Technologies, June 2006. Pages 180–189.
  • Zheng. Jun Fei Zheng, Hilmi Volkan Demir, Vijit A. Sabnis, Onur Fidaner, James S. Harris, Jr., David A. B.Miller. Self-Aligned Via and Trench for Metal Contact in III–V Semiconductor Devices. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Volume 24, Issue 3, May 2006. Pages 1117–1122.
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