Paul Calame, Assembly Test Manufacturing Information Systems, Intel Corporation
Ravi Nannapaneni, Assembly Test Manufacturing Information Systems, Intel Corporation
Scott Peterson, Assembly Test Manufacturing Information Systems, Intel Corporation
Jay Turpin, Assembly Test Manufacturing Information Systems, Intel Corporation
James Yu, Assembly Test Manufacturing Information Systems, Intel Corporation

Index words: supply chain, decision support systems, performance indicators, OLAP

ABSTRACT

We live in the Internet age, where businesses like Intel sell, buy, and manage internal operations in a fundamentally different way than just a few short years ago. Speed and agility have been added to the business performance equation: those that are fast and agile prosper, those that are not, don't. Our customers demand the ability to place and amend orders at will, require minimum inventory stock and just-in-time delivery, and desire order status visibility into the Intel supply line. These expectations drive internal demands for near real-time supply chain performance indicators from a variety of sources, a potential problem alert capability, and a look-ahead and environmental scan capability to support forward business planning.

This paper addresses one Intel program that focuses on satisfying these information needs with the specific objective of improving manufacturing operations and supply line performance.

The new implementation is called Cockpit reflecting its ability to provide the pilot with the necessary information to run day-to-day operations and avoid or detect problems. Based on industry standard technologies (e.g., OLAP¹), Cockpit is a new breed of Decision Support Systems (DSS) and one that has earned the confidence of Intel manufacturing professionals.

The Cockpit team shares the development process that led to the production system: the initial challenges, the development approach, the technology choices, the enterprise-wide data partnerships, and the various architectural details that make up the system.